1.

Conference Proceedings
Conference Proceedings
1. A study on the reason why prints made with only cyan and magenta inks look like regular full-color prints
Ikeda, M. ; Omodani, M.
Pub. info.: Color imaging X : processing, hardcopy, and applications : 17-20 January 2005, San Jose, California, USA.  pp.243-250,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5667
2.

Conference Proceedings
Conference Proceedings
2. Ka-Band and Millimeter-Wave Propagation Measurements using the COMETS Satellite
Wakana, H. ; Yamamoto, S.-I. ; Obara, N. ; Ikeda, M. ; Saito, H.
Pub. info.: AP 2000 : millennium Conference on Antennas & Propagation, Davos, Switzerland, 9-14 April 2000.  2000.  Noordwijk, Netherlands.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 444
3.

Conference Proceedings
Conference Proceedings
3. Effect of Aluminum on Oxide Growth and Oxide Charges in Silicon Wafers
Shimizu, H. ; Ikeda, M. ; Munakata, C. ; Nagashima, N.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.296-304,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
4.

Conference Proceedings
Conference Proceedings
4. Open loop method for waveform acquisition on electron-beam probe systems
Wang, H. ; Koike, H. ; Ikeda, M. ; Kanai, K.
Pub. info.: Advances in microelectronic device technology : 7-9 November 2001, Nanjing, China.  pp.154-159,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4600
5.

Conference Proceedings
Conference Proceedings
5. Determination of the Aluminum-Induced Oxide Charge by AC Surface Photovoltage Measurements in N-Type Silicon
Shimizu, H. ; Ikeda, M. ; Shin, R.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.31-36,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
6.

Conference Proceedings
Conference Proceedings
6. How to establish equivalence between two treatments in ROC analysis
Ikeda, M. ; Ishigaki, T. ; Yamauchi, K.
Pub. info.: Medical imaging 2003 : Image perception, observer performance, and technology assessment : 18-20 February 2003, San Diego, California, USA.  pp.383-392,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5034
7.

Conference Proceedings
Conference Proceedings
7. Controlled Association between Amphiphilic Polymers and Enzyme by Cyclodextrins in Heat Denatured Process: Artificial Molecular Chaperone
Akiyoshi, K. ; Ikeda, M. ; Sasaki, Y. ; Sunamoto, J.
Pub. info.: Proceedings of the International Conference on Colloid and Surface Science, Tokyo, Japan, November 5-8, 2000 : 25th Anniversary of the Division of Colloid and Surface Chemistry, the Chemical Society of Japan.  pp.89-92,  2001.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 132
8.

Conference Proceedings
Conference Proceedings
8. Grain Refinement in AZ91E Magnesium Alloy by Thermo-Mechanical Treatments
Yamamoto, A. ; Ikeda, M. ; Tsubakino, H.
Pub. info.: PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, Chin.  pp.493-496,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 475-479(1)
9.

Conference Proceedings
Conference Proceedings
9. 60-nm gate length SOI CMOS technology optimised for 'System-on-a-SOI-chip' solution
Imai, K. ; Maruyama, S. ; Suzuld, T. ; Kudo, T. ; Miyake, S. ; Ikeda, M. ; Abe, T. ; Masuda, S. ; Tanabe, A. ; Lee, J-W. ; Shibahara, K. ; Yokoyania, S. ; Qoka, H.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.149-158,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
10.

Conference Proceedings
Conference Proceedings
10. Structural Defects in Mg-Doped GaN and AlGaN Grown by MOCVD
Tomiya, S. ; Goto, S. ; Takeya, M. ; Ikeda, M.
Pub. info.: GaN and related alloys - 2002 : symposium held December 2-6, Boston, Massachusetts, U.S.A..  pp.839-844,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 743