1.

Conference Proceedings
Conference Proceedings
1. The Effect of the Oxide Network Structure on the Irradiation Behavior of SiO2 Films on Silicon
Revesz, A.G. ; Hughes, H.L.
Pub. info.: Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium.  pp.488-494,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-2
2.

Conference Proceedings
Conference Proceedings
2. Hydrogen in Buried SiO2 Layers
Revesz, A.G. ; Stahlbush, R.E. ; Hughes, H.L.
Pub. info.: The physics and chemistry of SiO2 and the Si-SiO2 interface-4, 2000 : proceedings of the fourth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface, Tronto, Canada, May 15-18, 2000.  pp.235-240,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-2
3.

Conference Proceedings
Conference Proceedings
3. Estimating proton induced SEU cross section of SOI CMOS SRAMS
Liu, S.T. ; Liu, H. ; Nelson, D.K. ; Flanery, M. ; Hughes, H.L.
Pub. info.: Silicon-on-insulator technology and devices XII : proceedings of the international symposium.  pp.107-112,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-03