1.

Conference Proceedings

Conference Proceedings
Meyer,B.K. ; Wagner,Mt. ; Dirnstorfer,I. ; Hofmann,D.M. ; Karg,F.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1467-1472,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Volm,D. ; Stadler,W. ; Meyer,B.K. ; Traudt,W. ; Sollner,J. ; Heuken,M. ; Wolf,K. ; Reisinger,T. ; Kurtz,L. ; Hommel,D. ; Hofmann,D.M.
Pub. info.: II-VI compounds and semimagnetic semiconductors : joint proceedings of the Third European Workshop on II-VI Compounds, Linz, Austria, 26-28 September 1994, and the Fourth International Workshop on Semimagnetic (Diluted Magnetic) Semiconductors, Linz, Austria, 26-28 September 1994.  pp.307-310,  1995.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 182-184
3.

Conference Proceedings

Conference Proceedings
Alt,H.C. ; Meye,B.K. ; Volm,D. ; Graber,A. ; Drechsler,M. ; Hofmann,D.M. ; Detchprohlm,T. ; Amano,A. ; Akasaki,I.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.17-22,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
4.

Conference Proceedings

Conference Proceedings
Hofmann,D.M. ; Meyer,B.K. ; Pawlik,T. ; Alteheld,P. ; Spaeth,J.-M.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.417-422,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
5.

Conference Proceedings

Conference Proceedings
Hofmann,D.M. ; Meyer,B.K. ; Christmann,P. ; Wimbauer,T. ; Stadler,W. ; Nikolov,A. ; Scharmann,A. ; Hofstatter,A.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1673-1678,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
6.

Conference Proceedings

Conference Proceedings
Stadler,W. ; Meyer,B.K. ; Hofmann,D.M. ; Kowalski,B. ; Emanuelsson,P. ; Omling,P. ; Weigl,E. ; Miiller-Vogt,G. ; Cox,R.T.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.399-404,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
7.

Conference Proceedings

Conference Proceedings
Wimbauer,T. ; Brandt,M.S. ; Bayerl,M.W. ; Stutzma,M. ; Hofmann,D.M. ; Mochizuki,Y. ; Mizuta,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1309-1314,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
8.

Conference Proceedings

Conference Proceedings
Hofmann,D.M. ; Meyer,B.K. ; Stadle,W. ; Kux,A. ; Petrova-Koch,V. ; Koch,F.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1459-1462,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
9.

Conference Proceedings

Conference Proceedings
Hofmann,D.M. ; Christmann,P. ; Volm,D. ; Pressel,K. ; Pereira,L. ; Santos,L. ; Pereira,E.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.79-84,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201