Scanning probe techniques for materials characterization at nanometer scale : proceedings of the International Symposium. pp.12-15, 2000. Pennington, N.J.. Electrochemical Society
Molter, M.I. ; Hegger, J. ; Habel, W.R. ; Hofmann, D. ; Gutmann, T. ; Basedau, F.
Pub. info.:
Smart structures and materials 2002 : smart sensor technology and measurement systems : 18-19 March 2002, San Diego, USA. pp.253-258, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Crail, S. ; Reichel, D. ; Schreiner, U. ; Lindner, E. ; Habel, W.R. ; Hofmann, D. ; Basedau, F. ; Brandes, K. ; Barner, A. ; Ecke, W. ; Schroeder, K.
Pub. info.:
Smart structures and materials 2002 : smart sensor technology and measurement systems : 18-19 March 2002, San Diego, USA. pp.259-264, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Habel, W.R. ; Hofmann, D. ; Kohlhoff, H. ; Knapp, J. ; Brandes, K. ; Haenichen, H. ; Inaudi, D.
Pub. info.:
Smart structures and materials 2002 : smart sensor technology and measurement systems : 18-19 March 2002, San Diego, USA. pp.236-241, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hofmann, D. ; Basedau, F. ; Habel, W. R. ; Gloetzl, R.
Pub. info.:
Second European Workshop on Optical Fibre Sensors : EWOFS '04 : 9-11 June 2004, Santander, Spain. pp.128-131, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Gloetzl, R. ; Hofmann, D. ; Basedau, F. ; Habel, W.
Pub. info.:
Smart structures and materials 2005 : Smart sensor technology and measurement systems : 7-9 March 2005, San Diego, California, USA. pp.248-253, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lebid, S.Y. ; Hofmann, D. ; Basedau, F. ; Daum, W.
Pub. info.:
Photonics, devices, and systems II :Proceedings from PHOTONICS PRAGUE 2002, 26-29 May 2002, Prague, Czech Republic, Miroslav Hrabovský, Dagmar Senderáková, Pavel Tománek, chairs/editors ; Organized by CSSF--Czech and Slovak Society for Photonics, Tech-Market. pp.366-371, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Weingaertner, R. ; Bickermann, M. ; Hofmann, D. ; Rasp, M. ; Straubinger, T.L. ; Wellmann, P.J. ; Winnacker, A.
Pub. info.:
Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000. pp.397-400, 2001. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Epelbaum, B. M. ; Hofmann, D. ; Muller, M. ; Winnacker, A.
Pub. info.:
Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999. pp.107-110, 2000. Zuerich, Switzerland. Trans Tech Publications
Muller, St. G. ; Fricke, J. ; Hofmann, D. ; Horn, R. ; Nilsson, O. ; Rexer, B.
Pub. info.:
Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999. pp.43-46, 2000. Zuerich, Switzerland. Trans Tech Publications