1.

Conference Proceedings
Conference Proceedings
1. EFFECT OF C IMPURITIES IN a-Si:H AS MEASURED BY DRIVE-LEVEL CAPACITANCE, PHOTOCURRENT, AND ELECTRON SPIN RESONANCE
Hautala, J. ; Unold, T. ; Cohen, J.D.
Pub. info.: Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A..  pp.375-380,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 297
2.

Conference Proceedings
Conference Proceedings
2. High Deposition Rate a-Si:H for the Flat-Panel Display Industry
Hautala, J. ; Saleh, Z. ; Westendorp, J. F. M. ; Meiling, H. ; Sherman, S. ; Wagner, S.
Pub. info.: Amorphous silicon technology, 1996 : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.83-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 420
3.

Conference Proceedings
Conference Proceedings
3. High Deposition Rate a-Si:H for the Flat Panel Display Industry
Hautala, J. ; Saleh, Z. ; Westendorp, J. F. M. ; Meiling, H. ; Sherman, S. ; Wagner, S.
Pub. info.: Flat panel display materials II : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.9-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 424