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Conference Proceedings

1. EFFECT OF ITOX-PROCESS ON THE ELECTRICAL CHARACTERISTICS OF BURIED OXIDE IN LOW-DOSE SIMOX

Hamada, K. ; Hamajima, T. ; Kitano, T. ; Ohnishi, H. ; Yoshino, A.

Pub. info.:	Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology. pp.1395-1405, 1998. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	98-1(2)

Conference Proceedings

2. Effect of Oxygen on the Formation of Dryetching Damage Introduced Into Si-Substrate

Hamada, K. ; Kitano, T.

Pub. info.:	Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.513-, 1998. Warrendale, Pa. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	510

Conference Proceedings

3. Impact of Metal Contamination of 7.0 nm Gate Oxides on Various Substrate Materials

Saito, S. ; Hamada, K. ; Eaglesham, D. J. ; Shiramizu, Y. ; Benton, J. L. ; Kitajima, H. ; Jacobson, S. D. C. ; Poate, J. M.

Pub. info.:	Science and technology of semiconductor surface preparation : symposium held April 1-3, 1997, San Francisco, California, U.S.A.. pp.81-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	477

Conference Proceedings

4. Enhanced Mechanical Properties of Smart Polymer-Matrix Hybrid Composite by Shape-Memory Effect

Izui, H. ; Hamada, K. ; Ogawa, K. ; Taya, M. ; Inoue, K.

Pub. info.:	Materials for smart systems II : sympsoium held December 2-5, 1996, Boston, Massachusetts, U.S.A.. pp.425-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	459

Conference Proceedings

5. Microstructures and Mechanical Properties of 6061 Al Matrix Smart Composite Containing TiNi Shape-Memory Fiber

Lee, J. H. ; Hamada, K. ; Mizuuchi, K. ; Taya, M. ; Inoue, K.

Pub. info.:	Materials for smart systems II : sympsoium held December 2-5, 1996, Boston, Massachusetts, U.S.A.. pp.419-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	459

Conference Proceedings

6. Mechanical Properties of Smart Metal-Matrix Composite by Shape-Memory Effects

Hamada, K. ; Lee, J. H. ; Mizuuchi, K. ; Taya, M. ; Inoue, K.

Pub. info.:	Materials for smart systems II : sympsoium held December 2-5, 1996, Boston, Massachusetts, U.S.A.. pp.143-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	459

Conference Proceedings

7. 13 Adsorption and Desorption of Platinum Complex on Au(111) Electrode

Uosaki, K. ; Ye, S. ; Oda, Y. ; Haba, T. ; Hamada, K.

Pub. info.:	Proceedings of the Sixth International Symposium on Electrode Processes. pp.168-179, 1996. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	96-8

Conference Proceedings

8. Investigation of Lateral and Vertical Profiles Enhanced by Implantation

Mineji, A. ; Hamada, K. ; Saito, S.

Pub. info.:	Ion-solid interactions for materials modification and processing : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.. pp.751-, 1996. Pittsburgh. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	396

Conference Proceedings

9. Anomalous Leakage Current Reduction by Ramping Rate Control in MeV Implantation

Hamada, K. ; Nishio, N. ; Saito, S.

Pub. info.:	Ion-solid interactions for materials modification and processing : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.. pp.739-, 1996. Pittsburgh. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	396

10.

Conference Proceedings

10. Impact of Metal Contamination of 7.0 nm Gate Oxides on Various Substrate Materials

Saito, S. ; Hamada, K. ; Eaglesham, D. J. ; Shiramizu, Y. ; Benton, J. L. ; Kitajima, H. ; Jacobson, S. D. C. ; Poate, J. M.

Pub. info.:	Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A.. pp.141-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	473

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