1.

Conference Proceedings

Conference Proceedings
H. Shin ; I. Song ; J. Park ; M. Han
Pub. info.: 2007 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT).  pp.249-254,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 8(1)
2.

Conference Proceedings

Conference Proceedings
C. Bae ; S. Kim ; H. Shin ; J. Kim
Pub. info.: Atomic layer deposition applications 3.  pp.149-154,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 11(7)
3.

Technical Paper

Technical Paper
Y. Liu ; A. Dowling ; H. Shin ; A. Quayle
Pub. info.: AIAA meeting papers on disc.  2007.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/CEAS Aeroacoustics Conference
Ser. no.: 2007
4.

Technical Paper

Technical Paper
C. Andreou ; W. Graham ; H. Shin
Pub. info.: AIAA meeting papers on disc.  2007.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.: 2007
5.

Technical Paper

Technical Paper
A. Quayle ; A. Dowling ; H. Babinsky ; W. Graham ; H. Shin ; P. Sijtsma
Pub. info.: AIAA meeting papers on disc.  2007.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.: 2007
6.

Conference Proceedings

Conference Proceedings
S. Park ; J. Lee ; H. Shin ; S. Choi ; M. Han
Pub. info.: 2007 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT).  pp.77-82,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 8(1)
7.

Conference Proceedings

Conference Proceedings
W. M. Lytle ; H. Shin ; D. N. Ruzic
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518
8.

Conference Proceedings

Conference Proceedings
B. Kim ; S. Lee ; H. Shin ; N. Lee
Pub. info.: Optical microlithography XX.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6520
9.

Conference Proceedings

Conference Proceedings
H. Shin ; S. N. Srivastava ; D. N. Ruzic
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518
10.

Conference Proceedings

Conference Proceedings
B. Lee ; H. Hong ; J. Park ; H. Park ; H. Shin ; I. Jung
Pub. info.: Stereoscopic displays and virtual reality systems XIV : 29-31 January 2007, San Jose, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6490