1.
Conference Proceedings
H. Shin ; I. Song ; J. Park ; M. Han
Pub. info.:
2007 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT) . pp.249-254, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:
ECS transactions
Ser. no.:
8(1)
2.
Conference Proceedings
C. Bae ; S. Kim ; H. Shin ; J. Kim
Pub. info.:
Atomic layer deposition applications 3 . pp.149-154, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:
ECS transactions
Ser. no.:
11(7)
3.
Technical Paper
Y. Liu ; A. Dowling ; H. Shin ; A. Quayle
Pub. info.:
AIAA meeting papers on disc . 2007. Reston, Va.. American Institute of Aeronautics and Astronautics
Title of ser.:
AIAA Paper : AIAA/CEAS Aeroacoustics Conference
Ser. no.:
2007
4.
Technical Paper
C. Andreou ; W. Graham ; H. Shin
Pub. info.:
AIAA meeting papers on disc . 2007. Reston, Va.. American Institute of Aeronautics and Astronautics
Title of ser.:
AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.:
2007
5.
Technical Paper
A. Quayle ; A. Dowling ; H. Babinsky ; W. Graham ; H. Shin ; P. Sijtsma
Pub. info.:
AIAA meeting papers on disc . 2007. Reston, Va.. American Institute of Aeronautics and Astronautics
Title of ser.:
AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.:
2007
6.
Conference Proceedings
S. Park ; J. Lee ; H. Shin ; S. Choi ; M. Han
Pub. info.:
2007 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT) . pp.77-82, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:
ECS transactions
Ser. no.:
8(1)
7.
Conference Proceedings
W. M. Lytle ; H. Shin ; D. N. Ruzic
Pub. info.:
Metrology, inspection, and process control for microlithography XXI . 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6518
8.
Conference Proceedings
B. Kim ; S. Lee ; H. Shin ; N. Lee
Pub. info.:
Optical microlithography XX . 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6520
9.
Conference Proceedings
H. Shin ; S. N. Srivastava ; D. N. Ruzic
Pub. info.:
Metrology, inspection, and process control for microlithography XXI . 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6518
10.
Conference Proceedings
B. Lee ; H. Hong ; J. Park ; H. Park ; H. Shin ; I. Jung
Pub. info.:
Stereoscopic displays and virtual reality systems XIV : 29-31 January 2007, San Jose, California, USA . 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6490