1.

Conference Proceedings
Conference Proceedings
1. PROPERTIES OF SINGLE-CRYSTAL SILICON FILMS ON AMORPHOUS SiO2 ON SINGLE-CRYSTAL CUBIC ZIRCONIA SUBSTRATES
Golecki, I. ; Maddox, R. L. ; Glass, H. L> ; Lin, a. L. ; Manasevit, H. M
Pub. info.: Applied materials characterization : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.37-46,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 48
2.

Conference Proceedings
Conference Proceedings
2. Si-ON-SAPPHIRE AND Si IMPLANTED WITH Zr IONS: LATTICE LOCATION, SOLID PHASE EPITAXIAL REGROWTH AND ELECTRICAL PROPERTIES
Golecki, I. ; Suni, I,
Pub. info.: Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A..  pp.541-546,  1983.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 14
3.

Conference Proceedings
Conference Proceedings
3. BURIED SiC LAYERS IN BULK SILICON AND SILICON-ON-SAPPHIRE PRODUCED BY CARBON ION IMPLANTATION
Kroko, L. ; Golecki, I. ; Glass, H. L.
Pub. info.: Ion beam processes in advanced electronic materials and device technology : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.323-328,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 45