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Discussion on standard 1/f noise models in software packages: SPICE, HSPICE and BSIM3v3--comparison to MOSFET noise data on commercial c025

Author(s):
Valenza, M. ( Univ. Montpellier II (France) )
Hoffmann, A. ( Univ. Montpellier II (France) )
Martinez, F. ( Univ. Montpellier II (France) )
Laigle, A. ( Univ. Montpellier II (France) )
Rhayem, J. ( AMI Semiconductor Belgium BVBA (Belgium) )
Gillon, R. ( AMI Semiconductor Belgium BVBA (Belgium) )
Tack, M. ( AMI Semiconductor Belgium BVBA (Belgium) )
2 more
Publication title:
Noise in Devices and Circuits
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5113
Pub. Year:
2003
Page(from):
494
Page(to):
502
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449733 [0819449733]
Language:
English
Call no.:
P63600/5113
Type:
Conference Proceedings

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