Blank Cover Image

The Surface Kinetics of the Initial Oxidation Stages of Copper as Investigated by In Situ Ultra-High Vacuum Transmission Electron Microscopy

Author(s):
Publication title:
High temperature corrosion and protection of materials volume 5 : proceedings of the 5th International Symposium on High Temperature Corrosion and Protection of Materials = Actes du 5è Colloque International sur la Corrosion et la Protection des Materiaux à haute Temperature, Les Embiez, France, May-mai 22-26 2000
Title of ser.:
Materials science forum
Ser. no.:
369-372
Pub. Year:
2001
Page(from):
133
Page(to):
140
Pages:
8
Pub. info.:
Uetikon-Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498772 [087849877X]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings In Situ UHV TEM Investigations of the Initial Oxidation Stage of Copper Thin Films

Yang, J. C., Yeadon, M., Kolasa, B., Gibson, J. M.

MRS - Materials Research Society
7 Conference Proceedings In Situ Observation of AIN Formation During Nitridation of Sapphire by Ultrahigh Vacuum Transmission Electron Microscopy

Yeadon, M., Marshall, M. T., Hamdani, F., Pekin, S., Morkoc, H., Gibson, J. M.

MRS - Materials Research Society
2 Conference Proceedings Kinetic Investigations of the Initial Oxidation Stage of Copper By In Situ UHV-TEM

Yang, J. C., Yeadon, M., Kolasa, B., Olynick, D., Gibson, J. M.

MRS - Materials Research Society
8 Conference Proceedings Transmission electron microscopy and diffraction from semiconductor interfaces and surfaces

Gibson M. J.

Plenum Press
3 Conference Proceedings IN-SITU TRANSMISSION ELECTRON MICROSCOPY STUDIES OF THE OXIDATION OF Si(111) 7x7

Gibson, J.M.

Materials Research Society
9 Conference Proceedings In Situ Hot-Stage High-Resolution Transmission Electron Microscopy of Interface Dynamics during Growth and Dissolution of {111}α Θ-Al2Cu Plates in an …

Howe,J.M., Benson,W.E., Garg,A., Chang,Y.C.

Trans Tech Publications
4 Conference Proceedings SURFACE STUDIES OF SILICON WITH A HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPE

Gibson, J.M., McDonald, M.L., Unterwald, F.C., Gossmann, H.-J., Bean, J.C., Tung, R.T.

Materials Research Society
10 Conference Proceedings *IN-SITU TRANSMISSION ELECTRON MICROSCOPY OF THE FORMATION OF METAL-SEMICONDUCTOR CONTACTS

Gibson, J. M., Loretto, D., Cherns, D.

Materials Research Society
5 Conference Proceedings *IN-SITU TRANSMISSION ELECTRON MICROSCOPY OF THE ETCHING OF SILICON (111) SURFACES BY OXYGEN

Gibson, J. M., Ross, F. M.

Materials Research Society
11 Conference Proceedings In Situ High-Resolution Transmission Electron Microscopy of the Amorphous to Crystalline Phase Transformation in Pd80Si20 Alloy

Howe,J.M.

Trans Tech Publications
6 Conference Proceedings IMPROVING SIGNAL-TO-NOISE LIMITS IN HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY

Gibson, J. M., McDonald, M. L.

Materials Research Society
12 Conference Proceedings THE USE OF FRESNEL CONTRAST TO STUDY THE INITIAL STAGES OF THE IN SITU OXIDATION OF SILICON

Ross, Frances H., Gibson, J. Murray, Stobbs, W.M.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12