A Correlation Study Of Thermal Stability On Porous Low-K
- Author(s):
Chow, Y.F. Foo, T.H. Shen, L. Pan, J.S. Du, A. Y. Xing, Z.X. Yuan, Y.J. Li, C.Y. Kumar, R. Foo, P.D. - Publication title:
- Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 716
- Pub. Year:
- 2002
- Page(from):
- 563
- Page(to):
- 568
- Pages:
- 6
- Pub. info.:
- Warrendale: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558996526 [1558996524]
- Language:
- English
- Call no.:
- M23500/716
- Type:
- Conference Proceedings
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