Optical design and testing II : 8-12 November 2004, Beijing, China. pp.744-751, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Gong, H. ; Xu, G. ; Zhu, S. ; Qui, H. ; Li, X. ; Liu, D. ; Zhu, L. ; Lin, X. ; Zhang, Y. ; Fang, J.
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Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany. pp.59640B-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Quantum optics and applications in computing and communications II : 10-12 November 2004, Beijing, China. pp.237-243, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China. pp.101-109, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Kang, Y. ; Li, X. ; Xu, Y. ; Tang, Y. ; Zhang, S. ; Xie, W. ; Gong, H. ; Fang, J.
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Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China. pp.78-85, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.760-763, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.741-746, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Microfluidics, bioMEMS, and medical microsystems : 27-29 January 2003, San Jose, California, USA. pp.120-129, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.865-869, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.810-813, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering