Application of the Crack Layer Method for Understanding of the Correlation between Lifetime and Creep Behavior in Polyethylene
- Author(s):
- Fan, J. ( University of Illinois at Chicago )
- Chen, D. ( The Dow Chemical Company )
- Shulkin, Y.
- Chudnovsky, A.
- Publication title:
- ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida
- Title of ser.:
- Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
- Ser. no.:
- 46
- Pub. Year:
- 2000
- Pt.:
- 3
- Page(from):
- 3138
- Page(to):
- 3142
- Pages:
- 5
- Pub. info.:
- Brookfield Center, CT: Society of Plastics Engineers, Inc. (SPE)
- ISBN:
- 9781566768559 [1566768551]
- Language:
- English
- Call no.:
- S42700/46
- Type:
- Conference Proceedings
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