1.

Conference Proceedings

Conference Proceedings
Deng, X. ; Zhan, J. ; Zhao, T. ; Zhu, L.
Pub. info.: Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA.  pp.58840P-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5884
2.

Conference Proceedings

Conference Proceedings
Huang, J. ; Zhu, L. ; Deng, X. ; Rozelle, S.
Pub. info.: Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA.  pp.58840I-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5884
3.

Conference Proceedings

Conference Proceedings
Chen, R. ; Deng, X. ; Zhan, J. ; Niu, W.
Pub. info.: Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA.  pp.58840N-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5884
4.

Conference Proceedings

Conference Proceedings
Deng, X. ; Wu, Y. ; Li, F. ; Zhou, L. ; Ming, X.
Pub. info.: ICO20 : MEMS, MOEMS, and NEMS : 21-26 August, 2005, Changchun, China.  pp.603208-603208,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6032
5.

Conference Proceedings

Conference Proceedings
Wang, J. ; Sciortino, P. ; Liu, P. ; Deng, X. ; Walters, F. ; Liu, X. ; Bacon, J. ; Chen, L.
Pub. info.: Nanoengineering: fabrication, properties, optics, and devices II : 3-4 August, 2005, San Diego, California.  pp.59310D-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5931
6.

Conference Proceedings

Conference Proceedings
Wang, J. ; Deng, X. ; Sciortino, P. ; Varghese, R. ; Nikolov, A. ; Liu, F. ; Chen, L.
Pub. info.: Nanoengineering: fabrication, properties, optics, and devices II : 3-4 August, 2005, San Diego, California.  pp.59310C-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5931
7.

Conference Proceedings

Conference Proceedings
Deng, X. ; Wang, Y. ; Yun, R. ; Peng, H.
Pub. info.: Image processing and pattern recognition in remote sensing :25-27 October 2002, Hangzhou, China.  pp.180-187,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4898
8.

Conference Proceedings

Conference Proceedings
Ferlauto, A.S. ; Ferreira, G.M. ; Chen, C. ; Rovira, P.I. ; Wronski, C.R. ; Collins, R.W. ; Deng, X. ; Ganguly, G.
Pub. info.: Photovoltaics for the 21st century II : proceedings of the international symposium.  pp.199-228,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-10
9.

Conference Proceedings

Conference Proceedings
Deng, X. ; Izu, M. ; Jones, S. J. ; Liu, T. ; Williamson, D. L.
Pub. info.: Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A..  pp.A7.4-,  2001.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 609
10.

Conference Proceedings

Conference Proceedings
Zhao, T. ; Liu, J. ; Zhuang, D. ; Deng, X. ; Chen, S.
Pub. info.: Remote sensing and modeling of ecosystems for sustainability : 2-4 August 2004, Denver, Colorado, USA.  pp.346-355,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5544