1.

Conference Proceedings
Conference Proceedings
1. Analysis of HALO implant influence on the self-heating and self-heating enhanced impact ionization on 0.13 μm floating-body partially-depleted SOI MOSFET at low temperature
Pavanello, M.A. ; Martino, J.A. ; Simoen, E. ; Mercha, A. ; Clacys, C. ; van Meer, H. ; De Meyer, K.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.389-394,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
2.

Conference Proceedings
Conference Proceedings
2. Emerging Device Solutions for the Post-Classical CMOS Era*
De Meyer, K. ; Collaert, N. ; Kubicek, S. ; Kottontharayil, A. ; van Meer, H. ; Verheyen, P.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.291-305,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-6
3.

Conference Proceedings
Conference Proceedings
3. Improved LOCOS Isolation for Ultra Thin 0.18 μm Fully-Depleted SOI CMOS
van Meer, H. ; De Meyer, K.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.301-306,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
4.

Conference Proceedings
Conference Proceedings
4. Degradation of Deep Submicron Partially Depleted SOI CMOS iransistors tinder MEV Proton or Gamma Irradiation
Simoen, E. ; Rafi, J.M. ; Mercha, A. ; De Meyer, K. ; Claeys, C. ; Kokkoris, M. ; Kossionides, E. ; Fanourakis, G. ; Mohhaindzadeh, A.
Pub. info.: Microelectronics technology and devices : SBMICRO 2003 : proceedings of the eighteenth international symposium.  pp.18-27,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-9
5.

Conference Proceedings
Conference Proceedings
5. P+/N Junction Formation in Thin Strain Relaxed Buffer Strained Silicon Substrates: The Effect of the Junction Anneal
Eneman, G. ; Simoen, E. ; Delhougne, R. ; Verheyen, P. ; Simons, V. ; Loo, R. ; Caymax, M. ; De Meyer, K. ; Vandervorst, W. ; Claeys, C.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.338-348,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-06
6.

Conference Proceedings
Conference Proceedings
6. The Low-Frequency Noise in n-MOSFETs on Strained Silicon: Is There Room for Improvement?
Simoen, E. ; Eneman, G. ; Verheyen, P. ; Delhougne, R. ; Rooyackers, R. ; Loo, R. ; Vandervorst, W. ; De Meyer, K. ; Claeys, C.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.349-359,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-06
7.

Conference Proceedings
Conference Proceedings
7. High-K Materials for Tunnel Barrier Engineering in Future Memory Technologies
Blomme, P. ; Govoreanu, B. ; Rosmeulen, M. ; Akheyar, A. ; Haspeslagh, L. ; De Vos, J. ; Lorenzini, M. ; Van Houdt, J. ; De Meyer, K.
Pub. info.: Dielectrics for nanosystems: materials science, processing, reliability, and manufacturing : proceedings of the First international symposium.  pp.169-182,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-04
8.

Conference Proceedings
Conference Proceedings
8. Radiation damage in deep submicron partially depleted SOI CMOS
Simoen, E. ; Rafi, J.M. ; Mercha, A. ; Serra-Gallifa, X. ; van Meer, H. ; De Meyer, K. ; Claeys, C. ; Kokkoris, M. ; Kossionides, E. ; Fanourakis, G.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.437-442,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
9.

Conference Proceedings
Conference Proceedings
9. Comparison Between 0.13 μm Partially-Depleted Silicon-On-Insulator Technology with Floating Body Operation at 300 K and 90 K
Pavanello, M.A. ; Martino, J.A. ; Mercha, A. ; Rafi, J.M. ; Simoen, E. ; Claeys, C. ; van Meer, H. ; De Meyer, K.
Pub. info.: Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium.  pp.205-212,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-8
10.

Conference Proceedings
Conference Proceedings
10. N+/P and P+/N Junctions in Strained Si on Thin Strain Relaxed SiGe Buffers: the Effect of Defect Density and Layer Structure
Eneman, G. ; Simoen, E. ; Delhougne, R. ; Verheyen, P. ; Ries, M. ; Loo, R. ; Caymax, M. ; Vandervorst, W. ; De Meyer, K.
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.119-124,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864