1.

Conference Proceedings
Conference Proceedings
1. NATIVE DEFECTS IN DIAMOND, SiC, AND Si: ENERGETICS AND SELF-DIFFUSION
Antonelli, A. ; Wang, C. ; Bernholc, J. ; Davis, R. F.
Pub. info.: Atomic scale calculations in materials science : symposium held November 28-December 1, 1988, Boston, Massachusetts, U.S.A..  pp.249-254,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 141
2.

Conference Proceedings
Conference Proceedings
2. *THE OCCURRENCE OF DEFECTS IN SILICON CARBIDES AS A RESULT OF PROCESSING MODE AND APPLIED STRESS
Carter Jr., C. H. ; Bentley, J. ; Davis, R. F.
Pub. info.: Defect properties and processing of high-technology nonmetallic materials : symposium held November 1983 in Boston, Massachusetts, U.S.A..  pp.351-364,  1984.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 24
3.

Conference Proceedings
Conference Proceedings
3. RESIDUAL DONORS IN β-SIC FILMS
Carlos, W. E. ; Moore, W. J. ; Siebenman, P..G. ; Freitas Jr., J. A. ; Kaplan, R. ; Bishop, S. G. ; Nordquist Jr., P. E. R. ; Kong, M. ; Davis, R. F.
Pub. info.: Novel refractory semiconductors : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.253-258,  1987.  Pittsburgh, Penn..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 97
4.

Conference Proceedings
Conference Proceedings
4. * PLASMA-ASSISTED CHEMICAL VAPOR DEPOSITION OF CERAMIC FILMS AND COATINGS
Davis, R. F.
Pub. info.: Processing science of advanced ceramics : symposium held April 27-28, 1989, San Diego, California, U.S.A..  pp.213-226,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 155
5.

Conference Proceedings
Conference Proceedings
5. PHOTOLUMINESCENCE AND RAMAN SPECTROSCOPY OF CUBIC SiC GROWN BY CHEMICAL VAPOR DEPOSITION ON Si SUBSTRATES
Freitas Jr., J. A. ; Bishop, S. G. ; Addamiano, A. ; Klein, P. H. ; Kim, H. J. ; Davis, R. F.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.581-586,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
6.

Conference Proceedings
Conference Proceedings
6. CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY OF DEFECTS IN BETA SILICON CARBIDE THIN FILMS
Carter Jr., C. H. ; Edmond, J. A. ; Palmour, J. W. ; Ryu, J. ; Kim, H. J. ; Davis, R. F.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.593-598,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
7.

Conference Proceedings
Conference Proceedings
7. *GROWTH, DOPING, DEVICE DEVELOPMENT AND CHARACTERIZSATION OF CVD BETA-SiC EPILAYERS ON Si (100) AND ALPHA-SiC (0001)
Kong, H. ; Kim, H,. J. ; Edmond, J. A. ; Palmour, J.. W. ; Ryu, J. ; Carter Jr., C. H. ; Glass, J. T. ; Davis, R. F.
Pub. info.: Novel refractory semiconductors : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.233-246,  1987.  Pittsburgh, Penn..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 97