Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China. pp.13-22, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.391-394, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Material science and material properties for infrared optoelectronics : 30 September-2 October 1996, Uzhgorod, Ukraine. pp.30-38, 1997. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.356-360, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering