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Conference Proceedings

1. 3D surface reconstruction of apples from 2D NIR images [6000-30]

Zhu, B. ; Jiang, L. ; Cheng, X. ; Tao, Y.

Pub. info.:	Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA. pp.60000R-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6000

Conference Proceedings

2. SiC Super Junction Power Devices: Modeling and Analysis

Shen, Z. J. ; Cheng, X. ; Kang, B. ; So, K. ; Hshieh, I.

Pub. info.:	Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy. pp.957-960, 2005. Uetikon-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	483-485

Conference Proceedings

3. Pattern classification for boneless poultry inspection using combined x-ray/laser 3D imaging [5996-30]

Chen, X. ; Jing, H. ; Tao, Y. ; Cheng, X.

Pub. info.:	Optical Sensors and Sensing Systems for Natural Resources and Food Safety and Quality. pp.59960T-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5996

Conference Proceedings

4. Gabor-wavelet decomposition and integrated PCA-FLD method for texture based defect classification [5996-32]

Cheng, X. ; Chen, Y.-R. ; Yang, T. ; Chen, X.

Pub. info.:	Optical Sensors and Sensing Systems for Natural Resources and Food Safety and Quality. pp.59960V-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5996

Conference Proceedings

5. Feature extraction and band selection methods for hyperspectral imagery applied for identifying defects [5996-31]

Cheng, X. ; Yang, T. ; Chen, Y. ; Chen, X.

Pub. info.:	Optical Sensors and Sensing Systems for Natural Resources and Food Safety and Quality. pp.59960U-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5996

Conference Proceedings

6. Real-time image analysis for nondestructive detection of metal silver in packed food [5996-15]

Chen, X. ; Jing, H. ; Tao, Y. ; Cheng, X.

Pub. info.:	Optical Sensors and Sensing Systems for Natural Resources and Food Safety and Quality. pp.59960E-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5996

Conference Proceedings

7. Preparation and properties of (Sm,Nd)(Tb,Dy)Co thin film with perpendicular anisotropy [5966-14]

Jin, F. ; Li, Z. ; Cheng, W. ; Sun, X. ; Cheng, X. ; Zhen, L. ; Lin, G.

Pub. info.:	Seventh International Symposium on Optical Storage (ISOS 2005). pp.59660E-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5966

Conference Proceedings

8. Investigations of LRE-HRE-TM thin films for hybrid recording [5966-09]

Li, Z. ; Cheng, X. ; Jin, F. ; Lin, G. ; Yang, X.

Pub. info.:	Seventh International Symposium on Optical Storage (ISOS 2005). pp.596609-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5966

Conference Proceedings

9. A minimax optimization approach to fabrication of CoCrPt thin film [5966-16]

Li, Z. ; Yang, X. ; You, L. ; Cheng, X. ; Jin, F. ; Yan, J. ; Wan, R. ; Sun, X.

Pub. info.:	Seventh International Symposium on Optical Storage (ISOS 2005). pp.59660G-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5966

10.

Technical Paper

10. Micro Thin Film Sensor Embedded in Metal Structures for In-Situ Process Monitoring During Ultrasonic Welding.

Cheng, X. ; Choi, H. ; Schwieso, P. ; Datta, A. ; Li, X.

Pub. info.:

SME technical paper. 2005. Society of Manufacturing Engineers

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