1.

Conference Proceedings
Conference Proceedings
1. Ge pile-up and defect formation during dry oxidation of SiGe
Daval, N. ; Guiot, E. ; Bourdelle, K. K. ; Kennard, M. ; Cayrefourcq, I. ; Akatsu, T. ; Mazure, C. ; Cerva, H. ; Rucki, A.
Pub. info.: Crystalline defects and contamination: their impact and control in device manufacturing IV : DECON 2005 : proceedings of the Satellite Symposium to ESSDERC 2005, Grenoble, France.  pp.42-51,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-10
2.

Conference Proceedings
Conference Proceedings
2. Influence of Overgrown Micropipes in the Active Area of SiC Schottky Diodes on Long Term Reliability
Rupp, R. ; Treu, M. ; Turkes, P. ; Beermann, H. ; Scherg, T. ; Preis, H. ; Cerva, H.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.925-928,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485