1.

Conference Proceedings
Conference Proceedings
1. RELAXATION DEFECT CHARACTERIZATION OF RTCVD Si1-XGeX/Si HETEROSTRUCTURES BY ELECTRICAL AND OPTICAL TECHNIQUES
Souifi, A. ; Bremond, G. ; Benyattou, T. ; Guillot, G. ; Dutartre, D.
Pub. info.: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.247-252,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 262
2.

Conference Proceedings
Conference Proceedings
2. SiGe Thin-Film Structures for Solar Cells
Bremond, G. ; Daami, A. ; Laugier, A. ; Seifert, W. ; Kittler, M. ; Poortmans, J. ; Caymax, M. ; Said, K. ; Konuma, M. ; Gutjahr, A. ; Silier, I.
Pub. info.: Thin-film structures for photovoltaics : symposium held December 2-5, 1997, Boston, Massachusetts, U.S.A..  pp.43-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 485
3.

Conference Proceedings
Conference Proceedings
3. Effect of Heavy Doping on the Photoluminescence and Photoreflectance Spectra of Silicon and SiGe Layers
Bru-Chevallier, C. ; Trui, B. ; Souifi, A. ; Bremond, G. ; Guillot, G. ; Chroboczek, J. A.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.295-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
4.

Conference Proceedings
Conference Proceedings
4. Electrical and optical properties of Yb, Er doped GaAs
Benyattou, T. ; Seghier, D. ; Bremond, G. ; Moneger, S. ; Kalboussi, A. ; Marrakchi, G. ; Guillot, G. ; Lhomer, C. ; Lambert, B. ; Toudic, Y. ; Corre A. Le
Pub. info.: Rare earth doped semiconductors : symposium held April 13-15, 1993, San Francisco, California, U.S.A..  pp.163-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 301