Ultrafast phenomena in semiconductors III : 27-29 January, 1999, San Jose, California. pp.168-178, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997. Part2 pp.1319-1322, 1998. Zuerich, Switzerland. Trans Tech Publications
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.87-92, 1994. Zurich, Switzerland. Trans Tech Publications
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.55-60, 1995. Zurich, Switzerland. Trans Tech Publications
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.93-98, 1994. Zurich, Switzerland. Trans Tech Publications
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.31-36, 1995. Zurich, Switzerland. Trans Tech Publications
Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997. Part2 pp.1115-1120, 1998. Zuerich, Switzerland. Trans Tech Publications
Light-Emitting Diodes: Research, Manufacturing, and Applications. pp.36-39, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering