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*MICRODEFECTS AND IMPURITIES IN DISCLOCATION-FREE SILICON CRYSTALS

Author(s):
  • Abe, T.
  • Hirada, H. ( Shin-Etsu, Handosai Co., Annaka-Shi, Gumma-Ker, Japan; )
  • Chikawa, J. ( NHK Broadcasting Science Research Laboratories, Kimuta, Setaga-Ku, Tokyo, Japan )
Publication title:
Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
14
Pub. Year:
1983
Page(from):
1
Page(to):
18
Pages:
18
Pub. info.:
New York: North-Holland
ISSN:
02729172
ISBN:
9780444008121 [0444008128]
Language:
English
Call no.:
M23500/14
Type:
Conference Proceedings

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