1.

Conference Proceedings
Conference Proceedings
1. Vacancy Defects in As-Polished and in High-Fluence H+-Implanted 6H-SiC Detected by Slow Positron Annihilation Spectroscopy
Barthe, M.-F. ; Desgardin, P. ; Henry, L. ; Corbel, C. ; Britton, D.T. ; Koegel, G. ; Sperr, P. ; Triftshauser, W. ; Vicente, P. ; diCioccio, L.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.493-496,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
2.

Conference Proceedings
Conference Proceedings
2. Vacancy Defects in As-Polished and in High-Fluence H+-Implanted 6H-SiC Detected by Slow Positron Annihilation Spectroscopy
Barthe, M.-F. ; Desgardin, P. ; Henry, L. ; Corbel, C. ; Britton, D.T. ; Kogel, G. ; Sperr, P. ; Triftshauser, W. ; Vicente, P. ; diCioccio, L.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.493-496,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393