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Conference Proceedings

1. Measurement of generation lifetime in partially depleted SOI MOSFETs

Shin, H C ; Racanelli, M ; Huang, W M ; Ford, J ; Foersiner, J ; Shin, H ; Wetteroth, T ; Hong, S Q ; Wilson, S R ; Schroder, D K ; Cheng, S

Pub. info.:	Proceedings of the Seventh International Symposium on Silicon-on-Insulator Technology and Devices. pp.263-270, 1995. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	96-3

Conference Proceedings

2. Residual stress in C54 Ti disilicide formed in silicon on insulator

Chen, C ; Tn, K N ; Wetteroth, T ; Wilson, S R

Pub. info.:	Proceedings of the Seventh International Symposium on Silicon-on-Insulator Technology and Devices. pp.189-198, 1995. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	96-3

Conference Proceedings

3. TFSOI CMOS technology for low power applications

Racanelli, M ; Huong, W M ; Shin, H C ; Foerstner, J ; Pork, H ; Ford, J ; Wetteroth, T ; Hong, S ; Shin, H ; Wilson, S R

Pub. info.:	Proceedings of the Seventh International Symposium on Silicon-on-Insulator Technology and Devices. pp.422-610, 1995. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	96-3