Blank Cover Image

DNS Study of Transient Disturbance Growth and Bypass Transition due to Realistic Roughness

Author(s):
Publication title:
AIAA meeting papers on disc
Title of ser.:
AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.:
2009
Pub. Year:
2009
No.:
2009-0585
Paper no.:
AIAA Paper 2009-0585
Pub. info.:
Reston, Va.: American Institute of Aeronautics and Astronautics
ISSN:
10877215
Language:
English
Call no.:
A07400/200901
Type:
Technical Paper

Similar Items:

K. Stephani, D. Goldstein

American Institute of Aeronautics and Astronautics

Leib, S.J., Wundrow, David W., Goldstein, M.E.

American Institute of Aeronautics and Astronautics

Funazaki, K., Wakita, Y., Otsuki, T.

American Society of Mechanical Engineers

Balakumar, P.

American Institute of Aeronautics and Astronautics

J. Strand, D. Goldstein

American Institute of Aeronautics and Astronautics

Reshotko, E., Tumin, A.

American Institute of Aeronautics and Astronautics

White, E.B., Ergin, F.G.

American Institute of Aeronautics and Astronautics

Vermeersch, Olivier, Arnal, Daniel

American Institute of Aeronautics and Astronautics

K. Stephani, K. Marr, R. Doctor, D. Goldstein

American Institute of Aeronautics and Astronautics

N. Denissen, R. Downs III,, E. White

American Institute of Aeronautics and Astronautics

Leib, S. J., Wundrow, David W., Goldstein, M.E.

American Institute of Aeronautics and Astronautics

McDaniel, R. D., Hassan, H. A.

American Institute of Aeronautics and Astronautics

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12