Blank Cover Image

Development of Durability Analysis Automation System. (DAAS)

Author(s):
Publication title:
2007 SAE world congress : technical paper
Title of ser.:
Society of Automotive Engineers technical paper series
Ser. no.:
2007
Pub. date:
2007
Serial:
2007-01-0949
Paper no.:
2007-01-0949
Pages:
5
Pub. info.:
Warrendale, Penn.: Society of Automotive Engineers
ISSN:
01487191
Language:
English
Call no.:
S10400
Type:
Technical Paper

Similar Items:

Choi, J., Choi, Y., Na, J., Lee, J.K., Jung, Y- U., Kim, S- H.

Society of Automotive Engineers

Allred, R.E., Shin, E.E., Papadopoulos, D., Wheeler, D., Sutter, J.K.

Society of Manufacturing Engineers

Choi,Jaehwan, Choi,Yangwook, Na,Jie, Lee,J.K., Jung,Yeon-Uk, Kim,Sang-Ho

Society of Automotive Engineering, Inc.

S. Lee, K. Choi,, J. Cho, S. Kim, J. Hyun, N. Kim,, J. Lee

American Institute of Aeronautics and Astronautics

Ahn, C.N., Bae, H., II., Lee, J.K., Lee, I.H., Shin, J-Y., Choi, H-Y.

Society of Automotive Engineers

Thesken, J.C., Shin, E.E., Burke, C., Sutter, J.K., Fink, J.

Society of Manufacturing Engineers

Cha, S-W., Ha, E-J., Lee, K-W., Chang, H.

Society of Automotive Engineers

Shin, K., Lee, C., Chang, S., Koo, J.

American Institute of Aeronautics and Astronautics

Park,J., Shin,D., Chung,B., Lee,S.

American Institute of Aeronautics and Astronautics

D. Lee, E. Shin, S. Won, J. Choi

American Institute of Aeronautics and Astronautics

J. Lee, D. Rigby, W. Wright, Y. Choo

American Institute of Aeronautics and Astronautics

K. Choi, G. Lee, B. Choi, S-J. Yoon, T. Lee, D-H. Choi, B-L. Choi, J-H. Choi

American Institute of Aeronautics and Astronautics

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12