Life Test of a Graphite-Orificed Hollow Cathode
- Author(s):
Y. Ohkawa ( Japan Aerospace Exploration Agency, Chofu, Tokyo, Japan ) Y. Hayakawa H. Yoshida K. Miyazaki S. Kitamura K. Kajiwara - Publication title:
- AIAA meeting papers on disc
- Title of ser.:
- AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
- Ser. no.:
- 2008
- Pub. Year:
- 2008
- No.:
- 2008-4817
- Paper no.:
- AIAA 2008-4817
- Pub. info.:
- Reston, Va.: American Institute of Aeronautics and Astronautics
- ISSN:
- 10877215
- Language:
- English
- Call no.:
- A07400/200808 [CD-ROM 2008 Disc 8]
- Type:
- Technical Paper
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