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Safety Envelope for Load Tolerance and Its Application to Fatigue Reliability Design

Author(s):
  • H. Wang ( University of Florida, Gainesville, FL )
  • N. Kim
  • Y. Kim ( Caterpillar Inc., Peoria, IL )
Publication title:
AIAA meeting papers on disc
Title of ser.:
AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.:
2006
Pub. Year:
2006
No.:
2006-1844
Paper no.:
AIAA Paper 2006-1844
Pub. info.:
[Reston, Va.]: American Institute of Aeronautics and Astronautics
ISSN:
10877215
Language:
English
Call no.:
A07400/200607 [CD-ROM 2006 Disc 7]
Type:
Technical Paper

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