Diode Laser-Based Systems for Process Monitoring and Control. | 東京工業大学附属図書館文献データベース

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Diode Laser-Based Systems for Process Monitoring and Control.

Author(s):: Wehe, S.D.
Publication title:: AIAA paper
Title of ser.:: AIAA Paper : AIAA Aerodynamic Measurement Technology and Ground Testing Conference
Ser. no.:: 2002
Pub. Year:: 2002
No.:: 2002-3042
Paper no.:: 2002-3042
Pages:: 11
Pub. info.:: American Institute of Aeronautics and Astronautics
ISSN:: 01463705
Language:: English
Call no.:: A07400
Type:: Technical Paper

Details

TDL ID:	ZA00001701
Series ID:	PA00000173
Conf. info. (Name):	AIAA Aerodynamic Measurement Technology and Ground Testing Conference
Conf. info. (Number):	22nd
Conf. info. (Venue):	St. Louis, MO
Conf. info. (Date):	2002.06.24-2002.06.26
Note for article:	22nd AIAA Aerodynamic Measurement Technology and Ground Testing Conference, St. Louis, Missouri, 24-26 June 2002

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