High Temperature Strain Measurement With a Resistance Strain Gage

High Temperature Strain Measurement With a Resistance Strain Gage

Author(s):

Lei, Jih-Fen ( Sverdrup Technology, Inc. Lewis Research Center Group )
Fichtel, Ed ( Pratt & Whitney - GESP )
McDaniel, Amos

Publication title:

NASA Technical Reports

Pub. Year:

1993

Issue:

NASA-CR-194441

No.:

G3/35 0198092

Pt.:

NAS 1.26:194441

Paper no.:

N94-19314

Page(from):

1

Page(to):

7

Pages:

7

Pub. info.:

National Aeronautics and Space Adminstration

Language:

English

Type:

Technical Paper

Details

TDL ID:	ZA00001430
Note for article:	NAS3-25266

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