Blank Cover Image

CHARACTERIZATION OF SILICON-GATE CMOS/SOS INTEGRATED CIRCUITS PROCESSED WITH ION IMPLANTATION

Author(s):
Woo, D. S. ( RCA Corporation )  
Publication title:
NASA Technical Reports
Pub. date:
1982
Issue:
NASA-CR-161988
Serial:
G3/33 19720
Pt.:
NAS 1.26:161988
Paper no.:
N84-29087
Page(from):
1
Page(to):
18
Pages:
18
Pub. info.:
National Aeronautics and Space Administration
Language:
English
Type:
Technical Paper

Similar Items:

Shinya Asai, Ryuichirou Abe, Yoshiko Isobe, Noriyuki Iwamori

Society of Automotive Engineers

Miyoshi, K., Heidger, S., Korenyi-Both, A.L., Jayne, D.T., Herrera-Fierro, Jayne P., Shogrin, B., Wilbur, P.J., Wu, …

National Aeronautics and Space Adminstration

Leonardo Navarenho de Souza Fino, Rafael Navarenho de Souza

Society of Automotive Engineers

Uebelhart, S., Miller, D., Blaurock, C.

American Institute of Aeronautics and Astronautics

Onneweer, S.P.

National Aeronautics and Space Adminstration

Buehier, M.G., Allen, R.A., Blaes, B.R., Hannaman, D.J., Lieneweg, U., Lin, Y.-S., Sayah, H.R.

National Aeronautics and Space Adminstration

Weinberg, I., Mehta, S., Swartz. C. K.

National Aeronautics and Space Administration

DARLAY, F., BASCHIERA, D., COURTOIS, B.

National Aeronautics and Space Adminstration

C. Pereira, S. Ahmed, S. H. D. Lee, M. Krumpelt

Society of Automotive Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12