
Fatigue properties of microelectronics solder joints
- Author(s):
- Nir, N. ( AT&T Bell Laboratories )
- Dudderar, T. D.
- Wong, C. C.
- Storm, A. R.
- Publication title:
- A.S.M.E. paper
- Title of ser.:
- ASME Technical Paper : WA/EEP
- Ser. no.:
- 1990
- Pub. Year:
- 1990
- No.:
- 90-WA/EEP-28
- Paper no.:
- 90-WA/EEP-28
- Pub. info.:
- New York, NY: The American Society of Mechanical Engineers
- Language:
- English
- Call no.:
- A11800
- Type:
- Technical Paper
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