The realities of data density and its effect on CMM measurement
- Author(s):
- Shelton, Russell S. ( Electronics Measuring Devices, Incorporated )
- Klaus J. Ulbrich
- Publication title:
- SME technical paper series
- Pub. Year:
- 1995
- No.:
- IQ95-156
- Paper no.:
- IQ95-156
- Page(from):
- 1P
- Pub. info.:
- Society of Manufacturing Engineers
- ISSN:
- 01616382
- Language:
- English
- Type:
- Technical Paper
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