A transient EHL analysis for line contacts with measured surface roughness using multigrid technique

A transient EHL analysis for line contacts with measured surface roughness using multigrid technique

Author(s):

Ai, Xiaolan ( Northwestern University )
Cheng, Herbert S.

Publication title:

A.S.M.E. paper

Title of ser.:

ASME Technical Paper : TRIB

Ser. no.:

1993

Pub. Year:

1993

No.:

93-Trib-56

Paper no.:

93-Trib-56

Pub. info.:

New York, NY: The American Society of Mechanical Engineers

Language:

English

Call no.:

A11800

Type:

Technical Paper

Details

TDL ID:	ZA00002580
Series ID:	PA00000191
Note for article:	Discussion on this paper will be accepted at ASME Headquarters until December 20, 1993

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