An apparatus for infrared transmittance and reflectance measurements at cryogenic temperatures

An apparatus for infrared transmittance and reflectance measurements at cryogenic temperatures

Author(s):

Zhang, Z. M. ( National Institute of Standards and Technology )
Hanssen, L. M.
Datla, R. U.
Drew, H. D.

Publication title:

A.S.M.E. paper

Title of ser.:

ASME Technical Paper : WA/HT

Ser. no.:

1995

Pub. Year:

1995

No.:

95-WA/HT-33

Paper no.:

95-WA/HT-33

Pub. info.:

New York: The American Society of Mechanical Engineers

Language:

English

Call no.:

A11800

Type:

Technical Paper

Details

TDL ID:	ZA00002339
Series ID:	PA00000203
Note for article:	Presented at the 1995 ASME International Mechanical Engineering Congree & Expositon San Francisco, California - November 12-17, 1995

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