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Extension of Stacking Faults in 4H-SiC pn Diodes under a High Current Pulse Stress

Author(s):
Y. Iwahashi
M. Miyazato
M. Miyajima
Y. Yonezawa
T. Kato
H. Fujiwara
K. Hamada
A. Otsuki
H. Okumura
4 more
Publication title:
Silicon Carbide and Related Materials 2016
Title of ser.:
Materials science forum
Ser. no.:
897
Pub. Year:
2017
Page(from):
218
Page(to):
221
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9783035710434 [3035710430]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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