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Physical Characterisation of 3C-SiC(001)/SiO2 Interface Using XPS

Author(s):
F. Li
O. Vavasour
M. Walker
D.M. Martin
Y.K. Sharma
S.A.O. Russell
M.R. Jennings
A. Pérez-Tomás
P.A. Mawby
4 more
Publication title:
Silicon Carbide and Related Materials 2016
Title of ser.:
Materials science forum
Ser. no.:
897
Pub. Year:
2017
Page(from):
151
Page(to):
154
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9783035710434 [3035710430]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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