Very large scale integration (VLSI) word size and precision analysis of the discrete wavelet transform

Very large scale integration (VLSI) word size and precision analysis of the discrete wavelet transform

Author(s):

Publication title:

Wavelet applications II : proceedings : 17-21 April 1995, Orlando, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2491

Pub. Year:

1995

Pt.:

2

Page(from):

1046

Page(to):

1055

Pages:

10

Pub. info.:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819418449 [0819418447]

Language:

English

Call no.:

P63600/2491

Type:

Conference Proceedings

Details

TDL ID:	ZA00057693
Series ID:	PA00000029
Conf. info. (Name):	Symposium on wavelet applications
Conf. info. (Number):	2nd
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1995.04.17-1995.04.21
Note for article:	2nd Symposium on wavelet applications, April 17-21, 1995, Orlando, FL, USA. 2491-96

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