Blank Cover Image

Large-Area, High-Throughput, High-Resolution Patterning and Via-Drilling System

Author(s):
Publication title:
1995 International Conference on Multichip Modules : proceedings : 19-21 April 1995, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2575
Pub. Year:
1995
Page(from):
327
Page(to):
335
Pages:
9
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780930815424 [0930815424]
Language:
English
Call no.:
P63600/2575
Type:
Conference Proceedings

Similar Items:

Jain,K., Dunn,T.J., Farmiga,N., Zemel,M.

SPIE - The International Society for Optical Engineering

Trebes,J.E., Dolan,K.W., Haddad,W.S., Haskins,J.J., Lerche,R.A., Logan,C.M., Perkins,D.E., Schneberk,D.J., Rikard,R.D.

SPIE-The International Society for Optical Engineering

Jain,K., Dunn,T.J., Farmiga,N., Zemel,M., Weisbecker,C.

SPIE-The International Society for Optical Engineering

M. Bavdaz, D. Lumb, K. Wallace, E. -J. Buis, G. Vacanti

Society of Photo-optical Instrumentation Engineers

Jain,K., Dunn,T.J., Farmiga,N., Zemel,M., Weisbecker,C., Lee,T.

SPIE-The International Society for Optical Engineering

Jain K. A.

Springer-Verlag

Jain,K., Dunn,T.J.

SPIE-The International Society for Optical Engineering

10 Conference Proceedings High Resolution Patterning with the STM

Marrian K. R. C., Dobisz A. E., Calvert M. J.

Kluwer Academic Publishers

Blanchet, Graciela B., Loo, Yueh-Lin, Rogers, J.A., Gao, F., Fincher, C.R.

Materials Research Society

B. Rodricks, B. Fowler, C. Liu, J. Lowes, D. Haeffner

Society of Photo-optical Instrumentation Engineers

F. Taghibakhsh, K. S. Karim

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12