Blank Cover Image

Digital recording and numerical reconstruction of holograms for nondestructive testing

Author(s):
Publication title:
Interferometry VII--applications : 13-14 July 1995, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2545
Pub. Year:
1995
Page(from):
250
Page(to):
253
Pages:
4
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819419040 [0819419044]
Language:
English
Call no.:
P63600/2545
Type:
Conference Proceedings

Similar Items:

U. Schnars, T.M. Kreis, W.P.O. Jüptner

Society of Photo-optical Instrumentation Engineers

Papp, Zs., Kornis, J., Gombkoeto, B.

SPIE-The International Society for Optical Engineering

Juptner,W.P., Pomarico,J.A., Schnars,U.

SPIE-The International Society for Optical Engineering

Nebrensky, J. J., Hobson, P. R., Fryer, P. C.

SPIE - The International Society of Optical Engineering

W.P. Jüptner, T.M. Kreis, U. Mieth, W. Osten

Society of Photo-optical Instrumentation Engineers

Kebbel,V., Hartmann,H.-J., Juptner,W.P.O.

SPIE-The International Society for Optical Engineering

Lu, Q., Ge, B., Zou, J., Sun, Y., Zhang, Y.

SPIE - The International Society of Optical Engineering

Cuche,E., Marquet,P., Magistretti,P.J., Depeursinge,C.D.

SPIE - The International Society for Optical Engineering

Kebbel,V., Hartmann,H.-J., Juptner,W.P.O., Schnars,U., Gatti,L., Becker,J.

SPIE - The International Society for Optical Engineering

T.M. Kreis, R. Biedermann, W.P.O. Jüptner

Society of Photo-optical Instrumentation Engineers

Holstein,D., Theiler,C., Hartmann,H.-J., Juptner,W.P.

SPIE - The International Society for Optical Engineering

Nebrensky, J. J., Hobson, P. R.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12