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Optoelectronic shearography: two wavelength slope measurement

Author(s):
Publication title:
Interferometry VII : techniques and analysis : 11-12 July 1995, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2544
Pub. Year:
1995
Page(from):
300
Page(to):
308
Pages:
9
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819419033 [0819419036]
Language:
English
Call no.:
P63600/2544
Type:
Conference Proceedings

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