Blank Cover Image

Roughness measurement of dielectrics with light scatter

Author(s):
Publication title:
Optical scattering in the optics, semiconductor, and computer disk industries : 13-14 July 1995, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2541
Pub. Year:
1995
Page(from):
36
Page(to):
44
Pages:
9
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819419002 [0819419001]
Language:
English
Call no.:
P63600/2541
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Multiple particle technique for determination of differential scattering cross section of very small surface bound particles

J.-C. Stover, M.L. Bernt

Society of Photo-optical Instrumentation Engineers
7 Conference Proceedings Optimization of organic light emitting diode structures

Chan, J.C., Rakic, A.D., Kwong, C.Y., Djurisic, A.B., Majewski, M.L., Chan, W.K., Chui, P.C.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings TIS uniformity maps of wafers, disks, and other samples

J.C. Stover, M.L. Bernt, T.F. Schiff

Society of Photo-optical Instrumentation Engineers
8 Conference Proceedings Optimum spectral system for impurity gas monitoring in atmosphere from scattering solar light

Gourari,M.L.

SPIE - The International Society for Optical Engineering
3 Conference Proceedings LIGHT SCATTERING MEASUREMENTS OF SURFACE ROUGHNESS IN MOLECULAR BEAM EPITAXY GROWTH OF GaAs

Lavoie, C., Nissen, M. K., Eisebitt, S., Johnson, S. R., Mackenzie, J. A., Tiedje, T.

MRS - Materials Research Society
9 Conference Proceedings On the Use of RMS Roughness for Surface Roughness Characterization

Mendez-Vilas, A., Nuevo, M.J., Gonzalez-Martin, M.L., Labajos-Broncano, L.

Trans Tech Publications
4 Conference Proceedings Light Scattering Measurements on Dust Aggregates: from MASER 8 to ISS

Levasseur-Regourd, A.C., Haudebourg, V., Cabane, M., Worms, J.C.

ESA Publications Division
10 Conference Proceedings Stress sensor based on light scattering by an array of birefringent optical waveguides

Limeres, J., Calvo, M.L., Lakshminarayanan, V., Enoch, J.M.

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Accurate sizing of deposited PSL spheres from light scatter measurements

Stover,J.C., Scheer,C.A.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Light scattering by periodic roughness at dielectric surface

Gruzdev,V.E., Gruzdeva,A.S.

SPIE - The International Society for Optical Engineering
6 Conference Proceedings Light Scattering Measurement of Surface Topography During Formation of Titanium Silicide

Lavoie, C., Cabral, C., Jr., Clevenger, L. A., Harper, J. M. E., Jordan-Sweet, J., Saenger, K. L., Doany, F.

MRS - Materials Research Society
12 Conference Proceedings Effect of Interface Roughness on Light Scattering and Optical Properties of a-Si:H Solar Cells

Metselaar, J. W., Schropp, R. E. I., vanSwaaij, R. A. C. M. M., Zeman, M., Zuiddam, M.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12