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Tip-sample distance control for near-field scanning optical microscopes

Author(s):
Publication title:
Near-field optics : 9-10 July, 1995, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2535
Pub. Year:
1995
Page(from):
69
Page(to):
81
Pages:
13
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819418944 [0819418943]
Language:
English
Call no.:
P63600/2535
Type:
Conference Proceedings

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