Blank Cover Image

Resolution and degrees of freedom in near-field scanning microscopy

Author(s):
Publication title:
Near-field optics : 9-10 July, 1995, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2535
Pub. Year:
1995
Page(from):
52
Page(to):
55
Pages:
4
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819418944 [0819418943]
Language:
English
Call no.:
P63600/2535
Type:
Conference Proceedings

Similar Items:

Wang, G., Wu, Q., Xu, Z.

SPIE - The International Society of Optical Engineering

Taylor,R.S., Leopold,K.E., Fraser,J.W., Feng,Y., Buchanan,M.

SPIE - The International Society for Optical Engineering

Wang, H., Liao, C., Fan, G., Liu, S.-H., Wu, Y., Wang, B., Zeng, G., Cai, J.

SPIE - The International Society of Optical Engineering

Xu, T.J., Xu, J.Y., Wang, J., Pan, D., Sun, L.Q., Tian, Q.

SPIE-The International Society for Optical Engineering

Fragola, A., Aigouy, L.

SPIE - The International Society of Optical Engineering

Zhang, W., Xu, G., Zhu, X.

SPIE - The International Society of Optical Engineering

Blattner, P., Kipfer, P., Herzig, H.P., Dandliker, R.

SPIE

Li, Y., Wu, S., Jian, G., Liu, K.

SPIE - The International Society of Optical Engineering

Fischer. C, U

Kluwer Academic Publishers

11 Conference Proceedings Scanning Near-Field Acoustic Microscopy

Fischer. C. U

Kluwer Academic Publishers

M.H.P. Moers, A.G.T. Ruiter, A. Jalocha, N.F. van Hulst, W.H.J. Kalle

Society of Photo-optical Instrumentation Engineers

12 Conference Proceedings Scanning Near-Field Infrared Microscopy

Gillman, Edward S.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12