Development of XUV interferometry (155Å) using a soft x-ray laser

Development of XUV interferometry (155Å) using a soft x-ray laser

Author(s):

Publication title:

Soft X-ray lasers and applications : 10-11 July, 1995, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2520

Pub. Year:

1995

Page(from):

288

Page(to):

296

Pages:

9

Pub. info.:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819418791 [081941879X]

Language:

English

Call no.:

P63600/2520

Type:

Conference Proceedings

Details

TDL ID:	ZA00057722
Series ID:	PA00000029
Conf. info. (Name):	Symposium on soft X-ray lasers and applications
Conf. info. (Number):	1995
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1995.07.10-1995.07.11
Note for article:	1995 Symposium on soft X-ray lasers and applications, July 10-11, 1995, San Diego, CA, USA. 2520-33

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