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Soft x-ray (50-1800 eV) measurements of niobium superconducting tunnel junctions

Author(s):
Publication title:
EUV, X-ray, and gamma-ray instrumentation for astronomy VI : 12-14 July 1995, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2518
Pub. Year:
1995
Page(from):
258
Page(to):
267
Pages:
10
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819418777 [0819418773]
Language:
English
Call no.:
P63600/2518
Type:
Conference Proceedings

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