Simultaneous materials evaluation with both electronic shearography and infrared nondestructive evaluation

Simultaneous materials evaluation with both electronic shearography and infrared nondestructive evaluation

Author(s):: M. Safai
Publication title:: Industrial optical sensors for metrology and inspection : 31 October-1 November 1994, Boston, Massachusetts
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 2349
Pub. Year:: 1995
Page(from):: 88
Page(to):: 92
Pages:: 5
Pub. info.:: Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:: 0277786X
ISBN:: 9780819416841 [0819416843]
Language:: English
Call no.:: P63600/2349
Type:: Conference Proceedings

Details

TDL ID:	ZA00057552
Series ID:	PA00000029
Conf. info. (Name):	Symposium on industrial optical sensors for metrology and inspection
Conf. info. (Number):	1994
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1994.10.31-1994.11.01
Note for article:	1994 Symposium on industrial optical sensors for metrology and inspection, October 31 - November 1, 1994, Boston, MA, USA. 2349-10

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