Use of single-event upsets in dynamic random access memories as the basis for a neutron detector

Use of single-event upsets in dynamic random access memories as the basis for a neutron detector

Author(s):

Publication title:

International Conference : neutrons and their applications : 12-18 June 1994, Crete, Greece

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2339

Pub. Year:

1995

Page(from):

266

Page(to):

270

Pages:

5

Pub. info.:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819416728 [081941672X]

Language:

English

Call no.:

P63600/2339

Type:

Conference Proceedings

Details

TDL ID:	ZA00057542
Series ID:	PA00000029
Conf. info. (Name):	International conference on neutrons and their applications
Conf. info. (Number):	1994
Conf. info. (Venue):	Crete, Greece
Conf. info. (Date):	1994.06.12-1994.06.18
Note for article:	1994 International conference on neutrons and their applications, June 12-18, 1994, Crete, Greece. 2339-33

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