Blank Cover Image

TDR-like low-frequency circuit test and characterization system for package and module interconnects utilizing transient thermal signals

Author(s):
Publication title:
Optical characterization techniques for high-performance microelectronic device manufacturing : 20 October 1994, Austin, Texas
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2337
Pub. Year:
1994
Page(from):
38
Page(to):
46
Pages:
9
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819416704 [0819416703]
Language:
English
Call no.:
P63600/2337
Type:
Conference Proceedings

Similar Items:

Pitner,Gregory, Flake,Robert H., Wong,Anthony

SPIE-The International Society for Optical Engineering

R. Clark, R.H. Flake, A. Siddique

Society of Photo-optical Instrumentation Engineers

Shon,S., Flake,R.H., Wong,A.

SPIE-The International Society for Optical Engineering

Conard,S.J., Redman,K.W., Barkhouser,R.H., McGuffey,D.B., Smee,S., Ohl,R.G., Kushner,G.D.

SPIE - The International Society for Optical Engineering

Linda P.B. Katehi

Society of Photo-optical Instrumentation Engineers

Buchholz,D.B., Lentine,A.L., Novotny,R.A.

SPIE-The International Society for Optical Engineering

4 Conference Proceedings Printing systems for MEMS packaging

Hayes,D.J., Cox,W.R., Wallace,D.B.

SPIE-The International Society for Optical Engineering

Franklin,M.L., Kittelson,D.B., Leuer,R.H., Pipho,M.J.

Society of Automotive Engineering, Inc.

Knoll, R.H.

National Aeronautics and Space Administration

Szekely,V., Rencz,Matta., Courrois,B.

IMAPS

Strzelecka,E.M., Morgan,R.A., Liu,Y., Walterson,B., Skogen,J., Kalweit,E., Bounak,S., Chanhvongsak,H., Marta,T., …

SPIE - The International Society for Optical Engineering

Mihailova, D.B., Grozeva, M.G., Bogaerts, A., Gijbels, R.H., Sabotinov, N.V.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12