Phase-shift mask metrology using scatterometry
- Author(s):
- Publication title:
- 14th annual Symposium on Photomask Technology and Management : proceedings : 14-16 September 1994, Santa Clara, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2322
- Pub. Year:
- 1994
- Page(from):
- 305
- Page(to):
- 315
- Pages:
- 11
- Pub. info.:
- Bellingham, WA: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819416537 [0819416533]
- Language:
- English
- Call no.:
- P63600/2322
- Type:
- Conference Proceedings
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